serw-MX  [xml]  

 DeCS Categories

E01 Diagnosis .
E01.370 Diagnostic Techniques and Procedures .
E01.370.350 Diagnostic Imaging .
E01.370.350.515 Microscopy .
E01.370.350.515.395 Microscopy, Confocal .
E01.370.350.515.402 Microscopy, Electron .
E01.370.350.515.402.541 Microscopy, Electron, Scanning .
E01.370.350.515.666 Microscopy, Scanning Probe .
E01.370.350.515.666.400 Microscopy, Atomic Force .
E05 Investigative Techniques .
E05.595 Microscopy .
E05.595.395 Microscopy, Confocal .
E05.595.402 Microscopy, Electron .
E05.595.402.541 Microscopy, Electron, Scanning .
E05.595.666 Microscopy, Scanning Probe .
E05.595.666.400 Microscopy, Atomic Force .
 Synonyms & Historicals
Microscopy, Scanning Probe .
Scanning Probe Microscopy .
Scanning microscopy in which a very sharp probe is employed in close proximity to a surface, exploiting a particular surface-related property. When this property is local topography, the method is atomic force microscopy (MICROSCOPY, ATOMIC FORCE), and when it is local conductivity, the method is scanning tunneling microscopy (MICROSCOPY, SCANNING TUNNELING). .
Microscopy, Atomic Force .
Atomic Force Microscopies .
Force Microscopies .
Force Microscopies, Scanning .
Force Microscopy, Scanning .
Microscopies, Atomic Force .
Microscopies, Force .
Microscopies, Scanning Force .
Microscopy, Force .
Microscopy, Scanning Force .
Scanning Force Microscopies .
Atomic Force Microscopy .
Force Microscopy .
Scanning Force Microscopy .
A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample. .
Microscopy, Electron, Scanning .
Electron Scanning Microscopy .
Electron Microscopies, Scanning .
Electron Microscopy, Scanning .
Electron Scanning Microscopies .
Microscopies, Electron Scanning .
Microscopies, Scanning Electron .
Microscopy, Electron Scanning .
Microscopy, Scanning Electron .
Scanning Electron Microscopies .
Scanning Microscopies, Electron .
Scanning Microscopy, Electron .
Scanning Electron Microscopy .
Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point. The image is constructed by detecting the products of specimen interactions that are projected above the plane of the sample, such as backscattered electrons. Although SCANNING TRANSMISSION ELECTRON MICROSCOPY also scans the specimen point by point with the electron beam, the image is constructed by detecting the electrons, or their interaction products that are transmitted through the sample plane, so that is a form of TRANSMISSION ELECTRON MICROSCOPY. .
Microscopy, Confocal .
Confocal Laser Scanning Microscopy .
Confocal Microscopies .
Laser Microscopies .
Laser Scanning Microscopies .
Microscopies, Confocal .
Microscopies, Laser .
Microscopies, Laser Scanning .
Microscopy, Laser .
Microscopy, Laser Scanning .
Scanning Microscopies, Laser .
Scanning Microscopy, Laser .
Confocal Microscopy .
Confocal Microscopy, Scanning Laser .
Laser Scanning Confocal Microscopy .
Microscopy, Confocal, Laser Scanning .
Laser Microscopy .
Laser Scanning Microscopy .
A light microscopic technique in which only a small spot is illuminated and observed at a time. An image is constructed through point-by-point scanning of the field in this manner. Light sources may be conventional or laser, and fluorescence or transmitted observations are possible. .