serw-MX  [xml]  

 DeCS Categories

E01 Diagnosis .
E01.370 Diagnostic Techniques and Procedures .
E01.370.350 Diagnostic Imaging .
E01.370.350.515 Microscopy .
E01.370.350.515.666 Microscopy, Scanning Probe .
E01.370.350.515.666.400 Microscopy, Atomic Force .
E05 Investigative Techniques .
E05.595 Microscopy .
E05.595.666 Microscopy, Scanning Probe .
E05.595.666.400 Microscopy, Atomic Force .
 Synonyms & Historicals
Microscopy, Atomic Force .
Atomic Force Microscopies .
Force Microscopies .
Force Microscopies, Scanning .
Force Microscopy, Scanning .
Microscopies, Atomic Force .
Microscopies, Force .
Microscopies, Scanning Force .
Microscopy, Force .
Microscopy, Scanning Force .
Scanning Force Microscopies .
Atomic Force Microscopy .
Force Microscopy .
Scanning Force Microscopy .
A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample. .
Microscopy, Scanning Probe .
Scanning Probe Microscopy .
Scanning microscopy in which a very sharp probe is employed in close proximity to a surface, exploiting a particular surface-related property. When this property is local topography, the method is atomic force microscopy (MICROSCOPY, ATOMIC FORCE), and when it is local conductivity, the method is scanning tunneling microscopy (MICROSCOPY, SCANNING TUNNELING). .